Scanning electron microscopy as a useful tool for the analysis of non-conductive materials
نویسندگان
چکیده
منابع مشابه
Scanning electron microscopy for materials characterization
Current materials are usually complex in chemistry, three-dimensional in form, and of rapidly diminishing microstructural scale. To characterize such materials the scanning electron microscope (SEM) now uses a wide range of operating conditions to target the desired sample volume, sophisticated modeling techniques to interpret the data. It also uses novel imaging modes to derive new types of in...
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ژورنال
عنوان ژورنال: IOP Conference Series: Materials Science and Engineering
سال: 2021
ISSN: 1757-8981,1757-899X
DOI: 10.1088/1757-899x/1161/1/012005